Accelerating your R&D with the advanced expertise only an equipment manufacturer can provide. Inquiry form for contract analysis (confidentiality and technical consultation available)

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Analytical Services Inquiry Form

Please fill out and submit the form below for any inquiries regarding our analytical services.
For urgent requests, please contact our Sales Department directly by phone for immediate assistance.
All information submitted through this form will be treated with the strictest confidentiality. We are fully prepared to enter into a Non-Disclosure Agreement (NDA) upon request.

ESCO, Ltd.
Oak Bldg 3F, 1-3-12 Nishikubo, Musashino, Tokyo 180-0013, JAPAN

TEL: +81-422-55-1011 (Sales Department)

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Department / Division Required
Full Name Required
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Postal Code / ZIP Code Required
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Inquiry Details Required Please provide as much detail as possible, referring to the entry example below.

Entry Example 1:
Semiconductor / Thin-Film Evaluation
(e.g., ALD Film)
【Specimen】
e.g., ALD-Al2O3 film on a Si substrate

【Specimen Size】
e.g., Diameter: 300 mm, Thickness: 0.775 mm
(ALD-Al2O3 film thickness: 10 nm)

【Specimen Color】
e.g., Substrate: Standard silicon wafer color;
Film: Colorless and transparent.

【Analytical Objective】
e.g., Quantification of moisture (H2O) content within the ALD- Al2O3 film.

【Target Gas Species】
e.g., H2O, Hydrogen (H2), Oxygen (O2)

【Heating Conditions】
e.g., Temperature Range: RT to 800°C,
Heating Rate: 60°C/min

【Number of Specimens】
e.g., 5 specimens

【Specimen Handling Precautions (Optional)】
e.g., Specimens will be shipped as full-size wafers. Please cleave/cut them at your facility.
Entry Example 2:
Oxide Semiconductor Evaluation
(e.g., IGZO Film)
【Specimen】
e.g., Oxide semiconductor film (IGZO film) on a glass substrate

【Specimen Size】
e.g., 10 mm × 10 mm × 0.5 mm (IGZO film thickness: 50 nm)

【Specimen Color】
e.g., Both substrate and film are colorless and transparent.

【Analytical Objective】
e.g., (1) Evaluation of hydrogen (H2) and moisture (H2O) desorption profiles within the IGZO film.
(2) Verification of whether Oxygen (O2) and Zinc (Zn) are desorbed/detected.

【Target Gas Species】
e.g., H2, H2O, Oxygen (O2), Zinc (Zn)

【Heating Conditions】
e.g., Temperature Range: RT to 600°C, Heating Rate: 30°C/min

【Number of Specimens】
e.g., 10 specimens

【Specimen Handling Precautions (Optional)】
e.g., Since distinguishing the front from the back of the specimen is visually difficult, a small "X" scribe mark has been placed on the back side (glass substrate side).

Entry Example 3:
Advanced Materials / Powder Evaluation
(e.g., Carbon Powder)
【Specimen】
e.g., Carbon powder

【Specimen Size】
e.g., Average particle size: 100 nm

【Specimen Color】
e.g., Black

【Analytical Objective】
e.g., (1) Qualitative and quantitative analysis of surface functional groups.
(2) Quantification of edge-bonded hydrogen.

【Target Gas Species】
e.g., H2, CO, CO2

【Heating Conditions】
e.g., Temperature Range: RT to 1700°C,
Heating Rate: 30°C/min

【Number of Specimens】
e.g., 2 specimens

【Specimen Handling Precautions (Optional)】
(Left Blank / Not Applicable)

Privacy PolicyRequired I agree to the Privacy Policy
*Agreement to our Privacy Policy is required to submit an inquiry.
Specimen Handling Policy • As a general rule, specimens will be returned after the analysis is completed.
• Since Thermal Desorption Spectroscopy (TDS) is a destructive analytical method involving high-temperature ramping, specimens may undergo structural, physical, or chemical changes during measurement.
• Depending on the material properties and specific testing conditions, recovery of the specimen may become difficult or unfeasible due to vaporization or volatilization.